Manufacturer of cutting edge optical measurement solutions
Film Thickness; Thickness; Uniformity Measurement; Ellipsometer; Microscopes: Confocal Scanning Microscope, 3-D Video Microscopes; Microscopes: Optical Microscopes; Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
Applications: Automotive (AE); Electronics for aviation, aerospace and defence (D)
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