Contact angle measuring devices with robot and SECS/GEM interface, micro scriber
Scribe and Break Equipment; Line Width; Critical Dimension (CD) Measurement; Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation; Dicing; Sawing; Scribing; Separation Equipment; Equipment: Inspection; Wireless, non-contact Test Systems
Applications: Automation (A); Electronics for aviation, aerospace and defence (D)
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