Manufacturer of optical, high-resolution surface measurement technology
Defect; Particle; Bump; Contamination Detection, Review or Inspection; Film Thickness; Thickness; Uniformity Measurement; Ellipsometer; Microscopes: Confocal Scanning Microscope, 3-D Video Microscopes; Microscopes: Optical Microscopes; Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
Applications: Automotive (AE); Consumer electronics (CO)
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