E+H Metrology
Measurement tools for the Semiconductor and PV in process control
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E+H offers for more than 40 years now a wide variety of measurement tools for the Semiconductor and PV in process control and laboratory characterization. Contactless metrology tools for 1" up to 450mm Wafers consisting out of Silicon, Quartz, Sapphire etc, but also solutions for other materials such as plastic displays are available. Most metrology tools can be integrated into our own full automated wafer handling solutions (belt driven, robot). This long term support for our customers combined with robust, reliable, mature and low maintenance products makes E+H a strong partner on which you can rely on.
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ABOUT
- Headquarters in Karlsruhe, Germany
- Founded in
- Number oof employees:
- Approx Revenue:
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Contact
- Address: Benzstraße 5-9, 76185 Karlsruhe, Germany
- Company Contact: 4972183118 info@eh-metrology.com
- Contact Person:
- Contact Person Email :
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Applications
Products & Services: CV (capacitance-to-voltage) Probe systems; Resistivity Measurement, 4 point probe; Sheet resistance; Stress; Refractive Index; Reflectivity & Conductivity Measurement; Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation