Advanced Metrology for Science & Industry - from R&D to Full-Scale Production
Die Inspection; Die Shear; Film Thickness; Thickness; Uniformity Measurement; Ellipsometer; Microscopes: Confocal Scanning Microscope, 3-D Video Microscopes; Package Inspection; Lead Scanners; Plate Inspection Equipment; Stress; Refractive Index; Reflectivity & Conductivity Measurement; Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation; Wire Bonding Inspection; Test; Inspection and Metrology; Failure Analysis Systems; Probe Card Maintenance and Analysis Systems
Applications: Automation (A); Consumer electronics (CO); Power Electronics and Energy Technology (PE)
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