About Bruker Nano Surfaces & Metrology

Empowering Semiconductor Excellence: Proven Metrology Solutions

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  • About

    • Headquarters in Berlin, Germany
    • Founded in
    • Number oof employees:
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    • Headquarters in Berlin, Germany
    • Founded in
    • Number oof employees:
    • Approx Revenue:

  • Products

    Defect; Particle; Bump; Contamination Detection, Review or Inspection; Film Thickness; Thickness; Uniformity Measurement; Ellipsometer; Line Width; Critical Dimension (CD) Measurement; Microscopes: Atomic Force Microscopes (AF); Microscopes: Confocal Scanning Microscope, 3-D Video Microscopes; Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation; CMP; Grind; Lap; Polish; Abrasive materials; Failure Analysis Systems

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More About Bruker Nano Surfaces & Metrology

Bruker delivers cutting-edge metrology solutions for the challenging demands of the semiconductor industry. Advanced automation systems and rapid, non-contact analysis tools facilitate applied materials research and process control in semiconductor manufacturing.Discover a comprehensive spectrum of solutions ranging from x-ray technology, AFM, and Stylus Profiling to Nano-Indentation, WLI, Ellipsometry, and nanoscale IR spectroscopy. Applications include critical dimension metrology, the nanoscale characterization of electrical, mechanical, and chemical properties, failure analysis and defect detection in wafer production, post-CMP and post-etch processes, and C-S thin films and multi-layer thin film characterization.Empowering semiconductor excellence with proven metrology solutions.

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